Preprint of the full paper (788 kb gziped postscript)
I. Halm [1], H.-J. Wiebicke [1], F.E. Christensen [2], P. Frederiksen [2], I. Rasmussen [2]
The
SODART
X-ray telescope includes an Objective Crystal Spectrometer
(OXS)
providing a high energy resolving power by Bragg reflection upon crystals. To cover a wide energy range, 3 types of natural crystals
(LiF, Si, RAP) and a Co/C multilayer structure upon Si are used in the ranges 5-11 keV, 2-5 keV, 0.5-1.2 keV, and 0.16-0.42 keV. All types of crystals besides Si being an ideal crystal (with parameters which were calculated) have been calibrated individually and after gluing onto the Bragg panel. The X-ray calibration procedures are described and results are discussed. A ray-tracing program using the OXS calibration data and simulating the X-ray photon reflection on the mentioned crystals and the multilayers has been developped and is described also.